Test Generation for Sequential Circuit Using PODEM Algorithm
نویسندگان
چکیده
We implement a test pattern generation algorithm for synchronous sequential circuits. The sequential test generation algorithm, which is effective for small and medium sized sequential circuits, is based on the PODEM algorithm. In this paper we first implement the standard PODEM algorithm using C++ which is fully tested using combinational circuits. Then we generate test patterns for sequential circuits from ISCAS-89 benchmark based on PODEM. The result shows that the test patterns for line stuck-at-faults can be successfully generated for small and medium sized sequential circuits. For very large sequential circuits, our implementation requires very long run time.
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